Quantifying Wheat Spike Traits with X-ray Computed Tomography

Dr. Yusuf Genc is a Research Scientist at SARDI with expertise in plant nutrition, physiology, and genetics in cereals. He is currently investigating the interactions between key yield components—spike number per square meter, grain number per spike, and grain weight—using a novel bread wheat germplasm with an increased number of grains per spike.

In this talk, Dr. Genc will present findings from a collaborative project between SARDI and the University of Adelaide. The study utilized X-ray computed tomography to quantify wheat spike architectural traits in a historical wheat set grown under both water-stressed and well-watered conditions.